MFM using Dimension 3100
Settings for doing MFM with AFM
Dimension 3100, by Bruker (formerly Digital Instruments, Veeco).
Tip used Multi75M-G from Budget Sensors, res. freq. 75 kHz, force const. 3 N/m,
magnetic, aluminium reflex.
Tapping mode, Interleave mode set to Lift.
Scanning window, sample is disk-platter from a 300 GB disk.
Images scanned from various locations on the 300 GB disk
platter. Phase image (magnetic field)
is to the left in pseudo color, height image in
grey scale to the right. All height images show a nearly flat surface,
as would be expected from a disk surface.
All images are processed and displayed using the free
Gwyddion
software.
15 x 15 µm field taken at about eleven o'clock on the disk
surface.
Zoom in to 1 x 1 µm, at about center of image above.
Another 1 x 1 µm area near previous location. The different
"slant" of the structures could be due to drift in the
piezos, system had been on for about one hour.
5 x 5 µm area closer to the center of the disk platter.
The skanned area is now moved a bit to the right to see the irregular
pattern at the right side.
Here the area is fully inside the irregular pattern.
Settings for scanning the magnetic test sample provided by Veeco.
Image during scanning of the tape test sample. Note the more grainy
surface in the height image (here left image), compared to the disk
platter.
5 x 5 µm area of the Veeco tape sample.
25 x 25 µm area, the magnetic
pattern is much bigger than that on a 300
GB disk platter.
Anders Liljeborg
Albanova Nanolab, KTH, SU.