For imaging a relatively smooth (features less than 100 nm tall) surface:
| Panel | Parameter | Setting |
|---|---|---|
| Image Scan | Scan Size | 2 µm |
| X Offset | 0 nm | |
| Y Offset | 0 nm | |
| Scan Angle | 90 deg. | |
| Slow Scan Axis | Enabled | |
| Fast retrace | Disable | |
| Samples per line | 64, 32 or 16 | |
| Z Scan | Ramp size | 100 nm |
| Ramp Rate | 4 Hz | |
| FV scan rate | 6 Hz | |
| Number of samples | 64, 256 or 512 | |
| Feedback | Trigger mode | Relative |
| Trig threshold | 10 nm | |
| Data Type | Deflection Error | |
| Image display | Realtime Plane Fit | Line |
| Offline Plane Fit | None | |
| Force Volume | Force per line | 64, 32 or 16 |
| Force Plot | Data Type | Deflection Error |
| www.bruker.com | Bruker Corporation |
| www.brukerafmprobes.com | 112 Robin Hill Rd. |
| nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
| Customer Support: (800) 873-9750 | |
| Copyright 2010, 2011. All Rights Reserved. |