Basic EFM Operation

Electric Force Microscopy (EFM) makes use of the Interleave technique known as LiftMode. Before you begin, ensure that you are familiar with TappingMode AFM and the theory and techniques necessary for Interleave Scanning and LiftMode.

Probe Requirements

• SCM-PIT (platinum/iridium coated probes)
• MESP (cost-effective electrically conductive probes coated with cobalt/chromium)
• Custom-coated FESP silicon TappingMode cantilevers (ensure that any deposited metal you use adheres strongly to the silicon cantilever)

Electric Force Microscopy Procedure

	Click the Select Experiment icon to open the Select Experiment window.
	Select the following: Experiment Category: Electrical & Magnetic Experiment Group: Electrical & Magnetic Lift Modes Select Experiment: MFM & EFM - Phase & Frequency
	In the Check Parameters view, on the Other drop down list, enable Tip Bias or Sample Bias (the other can be set to Ground):

	Enable the Expanded Mode view. In the Feedback drop down list, set the tip or sample bias: Tip Bias can be set between –12 V and +12 V Sample Bias can be set between –10 V and +10 V
	Electrically connect the sample by mounting it to a standard sample disk or stage using conducting epoxy or silver paint.

	Mount a metal-coated probe into the probe holder (see Prepare and Load the Probe Holder for more information).
	Set up the microscope for Basic TappingMode Operation.
	Tune the Cantilever using the AutoTune button in the Tune Cantilever panel of the Setup view.
	Continue with the procedure for either Phase Detection, Amplitude Detection, or Frequency Modulation as appropriate.

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