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How LFM Works

To produce Lateral Force Microscopy (LFM) data, the system is equipped with a cantilever detection scheme that measures both vertical and lateral bending of the cantilever. In Contact AFM, vertical bending of the cantilever is measured, representing changes in sample height. By measuring lateral bending (or twisting) of the cantilever as well, LFM data is used to monitor motions arising from forces on the cantilever that are parallel to the plane of the sample surface. Such forces can arise from changes in the frictional coefficient of a region on the sample surface or from onsets of changes in height. LFM is therefore useful for measuring lack of homogeneity in surface materials and producing images with enhanced edges of topographic features.

The LFM Signal
LFM Tip-Sample Interaction

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