This section provides detailed instructions for the fine calibration of the Dimension Icon SPM. In general the scanner’s calibration should be checked every three months. The main change in calibration will be the loss of piezo sensitivity in the first year of use. This is an expected behavior; loss of 10–15% of the initial scan size is common.
Bruker employs a software-guided calibration procedure for all microscopes. The procedural details of how calibration is executed using NanoScope software are beyond the scope of this User Guide and include proprietary methods exclusive to Bruker. The calibration is summarized in four basic steps outlined below.
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Bruker recommends that you adhere to the Calibration schedule shown in table 1. After initial installation, perform the Fine-tuning for XY Calibration per the following time schedule. If you find that the calibration measurements are more than 10% off at any point during Fine-Tuning Calibration, stop and perform the full XY calibration routine (Capture Calibration). For most applications it is sufficient to perform the Z calibration with the same frequency. For critical height measurements Bruker recommends monthly Z calibration.
Calibration Routine | Time Frame | Frequency |
---|---|---|
Fine-Tuning Calibration (or Full XY Calibration if required) | First Year | Every 3 months |
Subsequent Years | Every 6 months | |
Z Calibration (for General Applications) | First Year | Every 3 months |
Subsequent Years | Every 6 months | |
Critical Height Measurements | All Years | Monthly |
Table 1: Recommended calibration schedule
Depending on your application or the amount of time your system has been in use, you may need to run through one or more of the various Calibration Procedures to ensure optimal functioning of your Dimension Icon.
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