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Interpreting Hardness Data

By measuring the size of an indentation made by a measured force, it is possible to estimate the hardness of the sample surface. This is analogous to industrial hardness tests (e.g., Rockwell and Brinell tests) however, at the nanometric level precise one-to-one comparisons are elusive.

Force Calculations for Indentation

To calculate the force applied to the sample during indentation it is necessary to first measure the cantilever sensitivity. The cantilever sensitivity, called the Deflection sens. or TM Deflection Sens. in the software, is the cantilever deflection signal versus the voltage applied to the Z piezo determined from the slope of the force plot during indentation. The cantilever sensitivity is a conversion factor from cantilever deflection in volts to cantilever deflection in nm. Its units are nm/volt. Once the sensitivity is known, the force (F) of indentation is determined from Hooke's Law:

F = -kx

where k is the spring constant in N/m and x is the cantilever deflection (for this particular case). The cantilever deflection is determined from the cantilever sensitivity and the maximum deflection used for the indentation (Trigger threshold).

Measuring Cantilever Sensitivity

It is more accurate to measure the cantilever sensitivity on a very hard sample, since there is little surface penetration. Since the cantilever sensitivity is a measurement of the change in cantilever deflection per change in the Z position, it is important to have negligible sample penetration. If a change in Z position causes not only cantilever deflection but also sample penetration, the sensitivity measurement is inaccurate. For a soft sample, more Z motion is required to obtain the same deflection as on a hard sample. Thus the sensitivity is greater when measured on a harder sample.

NOTE: The deflection sensitivity is calculated based on the assumption that the tip and sample do not deform. The deflection sensitivity calibration must, therefore, be done on a hard, stiff surface.

The ideal sensitivity would be obtained on an infinitely hard sample. The ideal sensitivity is approached as the sample penetration approaches zero or as the hardness becomes infinite. It is suggested that a hard sample, such as the sapphire sample provided with the nanoindentation package, is used to measure the cantilever sensitivity before or after indenting the desired sample. The more accurate you need your calculation of the indentation force to be, the more important this becomes.

CAUTION: When indenting hard samples for sensitivity measurements, restrict the Trigger threshold to values less than 0.10 volts to prevent unnecessary damage to the tip.

The procedures for Force Calibration vary according to the mode selected. For detailed force calibration information, including procedures, see:

NOTE: The cantilever sensitivity should be measured prior to or immediately after performing hardness tests on the desired samples. In particular, the cantilever should not be moved or the laser repositioned between measuring the cantilever sensitivity and performing the hardness tests. If the tip is moved or the laser repositioned, the cantilever sensitivity will change.

Notes on Comparing Hardness Data

Nanoindentation is best suited for making relative, rather than absolute, hardness measurements. When making hardness comparisons, it is imperative that conditions be replicated as best as possible, preferably using the same diamond tip without repositioning the tip or changing the position of the laser spot on the cantilever during the tests. If it is necessary to compare many samples or many locations within a sample, or if the tip is replaced, note the following:

  1. Assume that tip “A” has a cantilever spring constant (k) of 200 N/m and a Deflection sensitivity of 160 nm/V. If the Trigger threshold is set to 0.50 V, the force, F, brought to bear on the surface would be:

F = -kx

Force (N) = Spring constant (N/m) x Trigger threshold (V) x Sensitivity (nm/V) x units conversion factor

equation

Here, k (200 N/m) is multiplied by the Trigger threshold times the Deflection sensitivity. The conversion factor, (1 x 10-–9 m /1 nm) is multiplied to convert the units properly to Newtons. It is absolutely critical that the cantilever’s sensitivity be calibrated as part of the force-measuring procedure; otherwise, results will be wrong.

  1. Next, assume that tip “B” has a cantilever spring constant (k) of 100 N/m and a Deflection sensitivity of 200 nm/V. If the objective is to apply the same amount of force to the sample, the Trigger threshold must be adjusted to compensate for the differences in spring constant and cantilever sensitivity. In this case, we will solve for the Trigger threshold:

Trigger threshold (V)

That is, by setting the Trigger threshold of tip “B” to 0.8 V, the same amount of force should be delivered to the surface as when using tip “A.” By observing dents creating by the two tips on the same sample surface, it is possible to obtain a subjective comparison. For this reason, it is useful to keep a “touchstone” nanoindentation standard. Recall that indentation sizes vary depending upon the sharpness of the diamond, even for tips mounted on cantilevers having the same spring constant. If the observed dents are grossly different, recheck the calculations—the Trigger threshold may be set incorrectly.

 

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