Check Optimized Vertical Domain PFM Parameters
Suggested initial scan parameters for Piezoresponse Force Microscopy (PFM) using the PFM Optimized Vertical Domains Operation workspace are detailed below. Parameters can be modified during scanning to obtain an optimized image. Most Piezoresponse control parameters can be found in the Piezo Response panel and have LS PR in the parameter name (LS refers to the low-speed lock-in setting, which its the default for this ).
- To reduce tip wear and increase resolution, set the Deflection Setpoint (in the Feedback panel) to a low value, 0.5 V is the default setting.
- Decrease this later while looking at an image to lower the force applied to the sample, or increase it to ensure contact on a rough, but robust sample. This low value assumes a stiff cantilever (such as MESP-RC or SCM-PIT).
- For an NPG probe, set the Deflection Setpoint to 2.0 V instead.
Figure 1: Parameter setup for Vertical Domain Piezoresponse Microscopy
- The following default settings should be in place in the Piezo Response panel (see Figure 1, above):
- Lock-In Type: Low Speed
- Vertical 16x Gain: Enabled (increase vertical sensitivity)
- To further increase vertical sensitivity (by 6x), reduce the Deflection Limit in the Limits panel to 4.096 V.
NOTE: Reducing the Deflection Limit provides additional bit resolution but does not multiply the deflection by a factor as the Vertical 16X Gain does.
Return to PFM Optimized Vertical Domains Operation.
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