Background

In the early 1980s, scanning probe microscopes (SPMs) dazzled the world with the first real-space atomic-scale images of surfaces. Now, SPMs are used in a wide variety of disciplines, including fundamental surface science, routine surface roughness analysis, and spectacular three-dimensional imaging—from atoms of silicon to micrometer-sized protrusions on the surface of a living cell.

SPM applications are very diverse. The SPM is an imaging tool with a vast dynamic range, spanning the realms of optical and electron microscopes. It is also a profiler with unprecedented resolution. In some cases, SPMs can measure physical properties such as surface conductivity, static charge distribution, localized friction, magnetic fields, and elastic moduli.

This introduction is intended to help you learn about SPMs, a process that should begin with a thorough understanding of the basics. Issues covered in this guide range from the fundamental physics of SPMs to practical capabilities and instrumentation. See How an SPM Works.

The origins of Bruker SPMs go back to the late 1980s. Since that time, we have maintained strong ties to the academic community and a corporate philosophy that combines technology leadership with a practical-applications orientation, working with customers to demonstrate the ability of our SPMs to meet their needs. We believe that the more you know about scanning probe microscopes, the more likely you will be to choose the best instrument for your work.

SPM Techniques

Scanning Probe Microscopy (SPM) consists of a family of microscopy forms where a sharp probe is scanned across a surface and probe/sample interaction is monitored. The two primary forms of SPM:

• Scanning Tunneling Microscopy (STM)
• Atomic Force Microscopy (AFM)

Open topic with navigation