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The Step analysis makes relative height measurements between two regions (steps) on sample surfaces. Typical applications include measuring film thickness and etch depths. Step works similarly to a Section analysis with an averaging box cursor, but its operation is simplified. |
Step displays a top view of the image, then the user draws a reference line across the regions to be measured. A height profile is generated from averaged data on either side of the reference line in the box. Cursors—which are moved along the profile—define specific regions (steps). These may be measured (Measure button) relative to each other, with or without data leveling (Level button).
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Figure 1: Select Step from the workspace
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Figure 3: Level Option Profile
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Parameter | Description |
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Measure |
Displays the relative height between steps |
Level |
Re-orients the profile so that the average height of each step region (between cursor pairs) is equal |
Restore |
Returns the profile to its original, unleveled form (De-selects the Level option) |
Results:
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Displays the distance between the average height of each region (between cursor pairs). If the height of the region between the second pair of cursors is lower than the firsts's, this will be a negative value. |
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