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System Specifications

The Dimension Icon system is designed to meet or exceed certain performance specifications, detailed in the table below.

Parameter Specification
XY Scan Range

90 μm x 90 μm typical

85 μm minimum

Z Range

10 μm typical in imaging and force curve modes

9.5 μm minimum

Vertical Noise Floor < 30 pm RMS in appropriate environment, typical imaging bandwidth (up to 625 Hz)
XY Position Noise (Closed Loop) ≤ 0.15 nm RMS typical imaging bandwidth (up to 625 Hz)
Z Sensor Noise Level

35 pm RMS typical imaging bandwidth (up to 625 Hz)

50 pm RMS force curve bandwidth (0.1–5 kHz)

Integral Nonlinearity (XY) < 0.50%
Integral Nonlinearity (Z) < 0.50%
Sample Size/Holder 210 mm vacuum chuck for samples ≤ 210 mm in diameter and ≤ 15 mm thick
Motorized Position Stage: X & Y Axis

180 mm x 150 mm inspectable area with rotating chuck

2 μm unidirectional repeatability

3 μm bidirectional repeatability

Microscope Optics

5-Megapixel digital camera

180–1465 μm viewing area

Digital zoom and motorized focus

Controller/Software NanoScope V/NanoScope v8.15 and later
Workstation Integrates NanoScope V, Stage Controller, HV Amplifiers, computer, and provides an ergonomic design with immediate physical and visual access
Vibration isolation Integrated (refer to Acoustic & Vibration Specifications)
Acoustic Isolation Operational in environment with up to 85 dBC continuous acoustic noise

 

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