The Dimension Icon system is designed to meet or exceed certain performance specifications, detailed in the table below.
Parameter | Specification |
---|---|
XY Scan Range |
90 μm x 90 μm typical 85 μm minimum |
Z Range |
10 μm typical in imaging and force curve modes 9.5 μm minimum |
Vertical Noise Floor | < 30 pm RMS in appropriate environment, typical imaging bandwidth (up to 625 Hz) |
XY Position Noise (Closed Loop) | ≤ 0.15 nm RMS typical imaging bandwidth (up to 625 Hz) |
Z Sensor Noise Level |
35 pm RMS typical imaging bandwidth (up to 625 Hz) 50 pm RMS force curve bandwidth (0.1–5 kHz) |
Integral Nonlinearity (XY) | < 0.50% |
Integral Nonlinearity (Z) | < 0.50% |
Sample Size/Holder | 210 mm vacuum chuck for samples ≤ 210 mm in diameter and ≤ 15 mm thick |
Motorized Position Stage: X & Y Axis |
180 mm x 150 mm inspectable area with rotating chuck 2 μm unidirectional repeatability 3 μm bidirectional repeatability |
Microscope Optics |
5-Megapixel digital camera 180–1465 μm viewing area Digital zoom and motorized focus |
Controller/Software | NanoScope V/NanoScope v8.15 and later |
Workstation | Integrates NanoScope V, Stage Controller, HV Amplifiers, computer, and provides an ergonomic design with immediate physical and visual access |
Vibration isolation | Integrated (refer to Acoustic & Vibration Specifications) |
Acoustic Isolation | Operational in environment with up to 85 dBC continuous acoustic noise |
www.bruker.com | Bruker Corporation |
www.brukerafmprobes.com | 112 Robin Hill Rd. |
nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
Customer Support: (800) 873-9750 | |
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