SCM Probe Selection and Mounting

SCM requires an electrically conductive probe tip. The potential for tip wear in Contact Mode is another important consideration in selecting a probe. Standard SCM tips include PtIr-coated tips for Contact Mode (SCM-PIC), PtIr-coated tips for TappingMode (SCM-PIT) (also used for Contact Mode), and CoCr coated (magnetic) Si tips (MESP). Less conductive alternative tips are diamond coated tips (DCT-ESP) if tip wear is a particular concern or uncoated standard Si tips (TESP) which may be custom coated. Any deposited metal must adhere well to the Si cantilever.

Refer to your instruction manual for mounting a probe in the probe holder and placing the probe holder in the SPM head. Refer to Dimension Hardware Description or MultiMode Hardware Description for details about making electrical contact between the SCM Application Module and the tip through the probe holder.

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