SSRM requires an electrically conductive tip. Different tips are preferred for different sample materials. We recommend using boron-doped diamond-coated silicon tips for silicon-based structures, and metal tips, metal-coated tips or diamond-coated tips for compound semiconductor materials (such as InP and GaAs-based structures). SSRM is operated in Contact Mode and requires a stable electrical contact necessitating fairly high contact force. Diamond or diamond-coated tips are often preferred to support the stress on the tip.
Refer to your instruction manual for mounting a probe in the probe holder and placing the probe holder in the SPM head. Refer to Dimension Hardware Description or MultiMode Hardware Description for details about making electrical contact between the SSRM Application Module and the tip through the probe holder.
www.bruker.com | Bruker Corporation |
www.brukerafmprobes.com | 112 Robin Hill Rd. |
nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
Customer Support: (800) 873-9750 | |
Copyright 2010, 2011. All Rights Reserved. |