C-AFM Probe Selection and Mounting

C-AFM requires an electrically conductive tip. The potential for tip wear in Contact Mode is another important consideration in selecting a tip. Standard C-AFM probes include PtIr-coated tips for Contact Mode (SCM-PIC) and CoCr coated (magnetized) Si tips (MESP). Less conductive diamond coated tips (DCT-ESP) are an alternative if tip wear is a particular concern.

Refer to your instruction manual to mount a tip in the probe holder and place the probe holder in the SPM head. See MultiMode Hardware Description or Dimension Hardware Description, for instructions regarding making electrical contact between the C-AFM Application Module and the tip through the probe holder.

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