SPM/AFM
(Surface Probe / Atomic Force Microscope)

Responsible: Anders Liljeborg

Bruker (formerly Veeco, Digital Instruments), Multimode Scanning Probe Microscope.

• Scanning tunneling Mode (STM)
• Magnetic Force Mode (MFM)
• Tapping Mode
• Wet Mode

Anti-vibration facilities.

Adjust scanner head
Video image on computer screen
Surface potential, a few hints.
MFM, a few hints.
STM, a few hints.

Guide to SPM, pdf-file
Calibration procedure, software v. 6
Translation stage, disassembled