Imaging Tools

Helios 5 Dual beam system (SEM/FIB)

FEI Nova 200 Dual beam system (SEM/FIB)
         EDX detector for element analysis

AFM Bruker ICON

AFM Bruker FastScan

AFM JPK Nanowizard 3 Bioscience

AFM JPK Nanowizard 3 Ultraspeed

AFM/SPM Bruker (Veeco) Multimode currently outside of Nanolab

Nikon ME600 Optical microscope, DIC, DF, 3 Mpix camera

Nikon ME600 Optical Microscope, DIC, DF, 5 Mpix camera

Nikon Eclipse L200, Optical microscope, wafer inspection

Nikon ME600 Fluorescence microscope, cooled 2 Mpix CCD camera

Stereo Microscope