After opening the captured image, you can analyze the image. In this example, the Flatten filter and Section analysis views are used.
![]() |
|
The Flatten filter can be used to remove image artifacts due to vertical (Z) scanner drift, image bow, skips, and anything else that may have resulted in a vertical offset between scan lines. Refer to Flatten for details.
|
|
![]() |
|
Section analysis allows you to easily make depth, height, width, and angular measurements. Refer to Section for details.
|
Preparing a Dimension Series AFM for a Realtime Scan
www.bruker.com | Bruker Corporation |
www.brukerafmprobes.com | 112 Robin Hill Rd. |
nanoscaleworld.bruker-axs.com/nanoscaleworld/ | Santa Barbara, CA 93117 |
Customer Support: (800) 873-9750 | |
Copyright 2010, 2011. All Rights Reserved. |